Residual Stress in Composites with the Thin-ring-slitting Approach
نویسندگان
چکیده
منابع مشابه
Investigation of Important Parameters in Residual Stress Determination in Isotropic Plates and Laminated Composites by Slitting Method
In the slitting method, a small width slit is created incrementally through the thickness of the stressed specimen and the released strains in each increment are recorded by a strain gauge. Compliance coefficients relate the measured strains to the residual stresses. This paper investigates the important parameters influencing the calculation of compliance coefficients for isotropic plates and ...
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In this research, the incremental slitting method was employed to determine throughthickness residual stress profile of a carbon/epoxy laminate. The method involves measuring strains at the back surface of the stressed specimen, while a narrow slit is cut by a CNC milling machine progressively from the top surface of the specimen. "Pulse Method" was selected as the computational approach for th...
متن کاملStress Variations Effect on the Accuracy of Slitting Method for Measuring Residual Stresses
To maintain the structural integrity of the engineering components, having an exact knowledge of residual stresses is important. Among all mechanical strain relief techniques to measure residual stresses, slitting is one of the youngest. This technique relies on the introduction of a narrow slot of increasing depth in a part containing residual stresses. Similar to other measurement techniques,...
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This paper examines the application of the incremental slitting technique for residual stress measurement to plastically deformed four-point bent beams and autogenously edge welded steel beams. Initially a study into a number of factors affecting the series expansion approach was conducted. Due to the over-determined nature of the series expansion approach appropriate selection of polynomial se...
متن کاملResidual Stress Variation in Polysilicon Thin Films
This paper compares the use of four mechanical methods for characterization of residual stress variation in low pressure chemical vapor deposited (LPCVD) polysilicon thin films deposited, doped, and annealed under different conditions. Stress was determined using buckling structures, vibrating microstructures, static rotating structures and the wafer curvature method. After deposition of 1.0 μm...
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ژورنال
عنوان ژورنال: Journal of Dental Research
سال: 2006
ISSN: 0022-0345,1544-0591
DOI: 10.1177/154405910608501015